Vipin Jain
Senior Test Lead
I love to read and write and speak. IoT is my latest love and this would be my 4th conference presentation on IoT. My speaking profile started in 2012 and I am lucky enough to have spoken across Europe, at least once every year since 2012. Key conferences include TestingUnited 2019, QA&Test, Bilbao Spain in 2012, 2016 and 2018, ExpoQA Madrid 2015, TestingCup 2017, Belgrade Testing Conference 2018, Poznan Meetups like PTaQ, WrotQA and Girls who Test in 2017 and 2018.

I work as a Sr. Test Lead for Metacube software, jaipur India. I have proven experience in refining processes for smoother deliveries across the globe. The projects give me stories and I collect the interesting ones to present.


Speech title: Securing IoT devices to Secure Data

The IoT testing challenge is unforeseen as it is testing the experience and not the testing of an experiment. The user has to use it and experience it to test it. IoT is collection of devices that are interconnected 24/7 and produce lots and lots of data which will be further analysed and useful patterns of usage is extracted from it. These Patterns will further help in improving IoT experience. As you can see, it involves a lot of data, and that is where the biggest challenge in IoT testing lies i.e. ensuring security of this data. Security testing and analysis is a pain for most of the industries and often they have faced embarrassment over lack of security. In addition, there is a lack of mechanisms that performs security testing for IoT devices in different contexts. In this paper I will try to expose the vulnerabilities that the IoT devices have.

I will highlight the primary reasons that can be:

1. IoT devices are prone to manipulations and can be attacked for data.

2. Lack of common security standards that can be applied to all IoT devices in general

3. Lack of dedicated Test suite that can perform the security testing

I will explain why we have adopted a layered structure for this testing and how can we reap benefits in testing IoT devices for securing. This layered structure has enabled to test any IoT device and the modular structure will help to run different types of tests.  
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